![[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)](https://image.mono.ipros.com/public/product/image/eea/2000240814/IPROS3960834512466909797.jpg?w=280&h=280)
[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis target area, allowing for elemental and compositional analysis. It is also referred to as Energy Dispersive X-ray Spectroscopy (EDS). In many cases, it is attached to a SEM or TEM, and this document introduces the EDX that accompanies the TEM. - Simultaneous analysis of the entire range of elements (from B to U) is possible (detection of Be is also possible depending on the attached device). - Measurements can be made with a fine electron beam probe of 0.1 nm in diameter or smaller. - By using drift correction functionality, sub-nanometer layered films can be identified as distribution images in surface analysis. - In surface analysis, it is possible to extract spectra from arbitrary locations and display line analysis.
- Company：一般財団法人材料科学技術振興財団 MST
- Price：Other
![[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM)](https://image.mono.ipros.com/public/product/image/c19/387108026/IPROS3784980461565155978.jpg?w=280&h=280)
